Functional Test

SUSS recently offers production solutions based on the extensive experience we have built over the past 40 years. Our solutions cover on-wafer functional tests of discrete devices with high chip count per wafer, optosemiconductor devices, MEMS sensors (pressure, acceleration, gyroscopes, microphones, etc.), SAW/BAW/FBAR, MMICs and more. Our unique solutions also reduce your cost of ownership with high throughput, reliability and precision.